Using magnetic eddy current integrated design, automatic identification of substrate type, Measurement range 0~ 1500μm, accuracy +/- 2%, Probe wear-resistant more than 500,000 times, suitable for various measurement environments.
Using eddy Current thickness measurement principle, Measurement range 0-1000μm, resolution 0.1μm, minimum measurable convex curvature 3mm, with automatic shutdown and low voltage prompt function.
Using magnetic Induction and eddy Current dual principle, Measurement range 0-1500μm, support continuous single two Measurement mode, with 500 sets of data storage and thermal printing function, the error is only +/- 3%.
Using magnetic Induction and eddy Current principle, Measurement range 0~ 1250μm, error +/- 3%, support Bluetooth transmission and automatic identification of matrix material, suitable for one-handed operation.
Using magnetic Induction and eddy Current dual thickness measurement method, Measurement range 0-1500 μm, resolution 0.1 μm, support continuous and single measurement, with statistical function and 500 sets of data storage.
Using magnetic and eddy current two thickness measurement methods, Measurement range 0-1250μm, with automatic identification of iron and non-iron matrix function, support single point and two point calibrating, with power supply undervoltage indication and statistical function.
Measuring methods of magnetic Induction and eddy Current, covering 0-1500 μm range, resolution up to 0.1 μm, support continuous and single Measurement mode, statistical function and 500 sets of data storage, suitable for different curvature radii and substrate Film thickness scenes.
Adopt magnetic eddy current integrated Probe, automatically identify the substrate, Measurement range 0-3000μm, accuracy +/- 2%, wear-resistant Probe life over 500,000 times, support single point and multi-point calibrating, adapt to various environments.
Measurement range 0~ 1250μm, resolution 0.1μm, support F-type and NF-type Probe, which can measure the thickness of cover layer on magnetically permeable and non-magnetically permeable substrates.
Measurement range of 0-1250 μm using eddy Current principle, single continuous dual mode and large Probe design, support Automatic calibration matrix recognition, error of only +/- 3% resolution up to 0.1 μm.
Using magnetic Induction and eddy current double thickness measurement method, Measurement range 0-1250μm, error +/- 3%, automatic identification of iron and non-iron matrix, with statistical function and undervoltage indication, easy to operate.
Using magnetic Induction and eddy Current dual principle, Measurement range 0-2000μm, resolution up to 0.1μm, with automatic identification of substrate function and Data storage ability, support surface measurement minimum convex 1.5mm.
Using magnetic Induction and eddy Current dual principle, Measurement range 0~ 2000µm, error +/- 1~ 3%, with automatic identification of matrix material and memory Adjustment, support split Probe to enhance mobility.
Using magnetic Induction and eddy Current dual principle, Measurement range 0~ 500μm, resolution of 0.1μm, wear-resistant hard metal probe and Automatic calibration function, support USB data communication.
Using magnetic Induction and eddy Current principle, Measurement range 0~ 500um, resolution 0.1μm, wear-resistant hard metal probe and Automatic calibration function, support single and continuous Measurement mode.
