Overview
The TEELEN XTL-207B Continuous Diploidy Microscope provides a good Optical inspection system and a durable and reliable operating mechanism, equipped with complete accessories and diverse combinations to meet the requirements of modern scientific research, modern electronic industry online inspection and Miscellaneous technology industry. High Accuracy requirements.
Features
1. Optical inspection components plated with special layers create high-quality Optical inspection images
2. A flat image plane and a good contrast ratio are formed in a large field of view, and the image quality of the peripheral field of view is brighter and clearer
3. Continuous zoom objective 0.7X~ 4.5X (6.3:1), standard magnification 7X~ 45X, optional auxiliary objective up to 14X~ 180X
4. The effective standard working distance is 100mm, and the optional auxiliary objective can be extended to 26mm~ 287mm.
5. The observation head is tilted 45 °, and the binocular visibility is adjustable to adapt to different vision users
6, ergonomic design, eye point height comfort, long time use is not easy fatigue
7, variable hand wheel horizontal bilateral setting, easy to operate and comfortable, variable, high repeability accuracy
8, with a variety of accessories, expand the application field
Principle
The Microscope achieves a magnification range of 0.7X~ 4.5X through a continuous zoom objective system, and forms a clear Optical inspection image with a high-eye point and large-field eyepiece. The 45 ° tilt observation head and adjustable pupil distance design ensure a comfortable observation experience for users.
Applications
Modern Scientific Research, Modern Electronic Industry Online Testing, High Accuracy Testing in Science and Technology Industry
Steps
1. Adjust the pupil distance to within the range of 54-76mm
2. Adjust the visibility to within the +/- 5 diopter range
3. Select the desired magnification through the variable magnification handwheel
4. Use the focusing frame for fine focusing
5. Turn on the upper and lower LED light sources for observation
