Overview
BM-62XCD reflection polarized microscope is a commonly used instrument for studying and identifying birefringent substances by using the polarization characteristics of light. It can be used for mono-polarized observation, orthogonal polarized observation, and cone light observation by the majority of users. It is widely used in research and inspection in geology, chemical industry and other fields, and can also be used for crystal phase observation of liquid polymer materials and liquid crystal materials. It is a commonly used instrument for research and teaching in scientific research institutions and colleges and universities. The instrument adopts electric Illuminant, the lighting can continuously adjust the luminance, and the hinged triocular barrel is tilted at 30 °, which can rotate 360 degrees freely.
Features
1. Illuminant, continuous adjustment of luminance
2. The hinged three-eyepiece barrel is tilted 30 ° and can rotate 360 degrees freely
3. Optical inspection system provides clear imagery
4. Equipped with 5 million pixel CMOS camera, with geometric measurement analysis software
5. Optional 10 million or 20 million pixel CMOS camera
6. Condenser with polarizer can be 360 ° swirl/spin, N. A = 1.25 Abbe condenser with variable light bar
7. Centric unit plug-in polarizer with 360 ° swirl/spin, with scale and fretting vernier; push-in Boehr mirror, lambda, lambda/4 and quartz wedge compensator
Principle
BM-62XCD Transmittent reflection Polarizing Microscope uses the polarization characteristics of light to study and identify birefringent substances, and analyzes the crystal structure and Optical inspection properties of the samples by single polarization observation, orthogonal polarization observation and cone light observation.
Applications
Observe the crystal structure, grain, grain boundary and other information of the metal surface, observe the uniformity, adhesion and mass of the coating, check the defect, structure and layer thickness of the chip surface, observe the microstructure and mass of the ceramic surface, study the surface properties of the material, texture, crystal structure, etc
Steps
1. Turn on the instrument power and adjust the lighting luminance
2. Place the sample on the swirl/spin table
3. Perform coarse fretting focusing through the focusing mechanism until the image is clear
4. Select the appropriate objective and eyepiece for observation
5. Adjust polarization conditions using condensers and detectors
6. Capture images through imagery system and perform geometric measurement analysis
Notice
• Make sure the instrument power supply is stable before operation
• Avoid direct contact with Optical inspection components to prevent contamination
• Use the fretting grid value of 0.002mm for fine adjustment when focusing
• Turn off the power in time after use and clean the workbench
• The computer needs to be purchased by yourself to ensure compatibility with the imagery system
