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| Product Name | YUEFENG 770 UV-Visible SpectroPhotometer | Yoke T2600 UV-Visible SpectroPhotoMeter |
| Product Price | $2252.00 | In coming |
| Details | Details | |
| Model comparison | ||
| Spectral Type | UV-Vis | UV-Vis |
| Optical Path | Pseudo-Double-Beam | Pseudo-Double-Beam |
| Dispersion | Grating | Grating |
| Detection | Scanning | Scanning |
| Light Source | Tungsten Deuterium | Tungsten Deuterium |
| Wavelength | 190-1100nm | 190-1100nm |
| Accuracy | ≤0.5nm | ≤0.5nm |
| Bandwidth | ≤2nm | ≤2nm |
| Detector | Silicon Photodiode | |
| Stray Light | ≤0.1%T | |
| Parameter comparison | ||
| Optical inspection system | Proportional double beam of light, 1200/mm Holographic grating | Proportional double beam of light 1200/mm Holographic grating |
| Light spectrum Bandwidth | 2nm | 2.0 nm |
| Wavelength Range | 190nm~1100nm | |
| Wavelength Precision | ±0.5nm | ±0.3 nm |
| Wavelength Repeatability | ≤0.2nm | ≤0.1 nm |
| Photometric Range | 0.0%(T)~200.0%(T)；-0.301~4.000(A) | 0-200%T，-3-3A，0-9999C (0-9999F) |
| Photometric Precision | ±0.5%(T) | |
| Luminosity Repeatability | ≤0.2%(T) | |
| stray light | ≤ 0.15% (T) (at 220 nm, as NaI) (at 360 nm, as NaNO2) | ≤ 0.1% T at 420nm, ≤ 0.05% T at 220nm/340nm |
| Noise level | 100%(T):≤0.2%(T) 0%(T):≤0.1%(T) | |
| printout | RS232 printing interface | |
| Illuminant | Deuterium lamp, tungsten halogen lamp | |
| drift | ≤ 0.0009A/0.5h (2h after startup, 250nm, 500nm) | |
| Ambient Temperature | 5℃~35℃，≤85% | |
