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| Product Name | YUEFENG 770S UV-Visible SpectroPhotometer | Yoke T-U6 Photomultipliers double beams of light |
| Product Price | $2591.00 | In coming |
| Details | Details | |
| Model comparison | ||
| Spectral Type | UV-Vis | UV-Vis |
| Optical Path | Pseudo-Double-Beam | Double-Beam |
| Dispersion | Grating | |
| Detection | Scanning | |
| Light Source | Tungsten Deuterium | Tungsten Deuterium |
| Wavelength | 190-1100nm | 190-1100nm |
| Accuracy | ≤0.5nm | ≤0.5nm |
| Bandwidth | ≤2nm | ≤2nm |
| Detector | PMT | |
| Stray Light | ≤0.2%T | ≤0.05%T |
| Parameter comparison | ||
| Optical inspection system | Proportional double beam of light, 1200/mm Holographic grating | Double beam of light, CT Proportional Detector |
| Light spectrum Bandwidth | 2nm | 2nm |
| Wavelength Range | 190nm~1100nm | |
| Wavelength Precision | ±0.5nm | Full wavelength 0.3nm (656.1nm 0.1nm) |
| Wavelength Repeatability | ≤0.2nm | 0.1nm |
| Photometric Range | 0.0%(T)~200.0%(T)；-0.301~4.000(A) | |
| Photometric Precision | ±0.5%(T) | |
| Luminosity Repeatability | ≤0.2%(T) | |
| stray light | ≤ 0.15% (T) (at 220 nm, as NaI) (at 360 nm, as NaNO2) | 0.01%（220nm） |
| Noise level | 100%(T):≤0.2%(T) 0%(T):≤0.1%(T) | |
| Baseline flatness | ±0.002A(200nm~1090nm) | |
| printout | RS232 printing interface | |
| Illuminant | Deuterium lamp, tungsten halogen lamp | |
| drift | ≤ 0.0009A/0.5h (2h after startup, 250nm, 500nm) | |
| Ambient Temperature | 5℃~35℃，≤85% | |
| scanning speed | Fast, medium, slow. | |
