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| Product Name | 3NH YD5010 Grating Spectroscopic Density Meter | 3NH TS8210 Benchtop ColoriMeter |
| Product Price | $3268.00 | $6496.00 |
| Details | Details | |
| Model comparison | ||
| Sample type | Plane | Plane |
| Measurement aperture | Φ4mm Φ8mm Miscellaneous | Φ4mm Φ8mm |
| Measurement Geometry | 45°/0 | D/8 |
| Color difference formula | ΔE*ab ΔE*94 ΔE*00 | ΔE*ab ΔE*uv ΔE*94 ΔE*00 ΔE*cmc(2:1) ΔE*cmc(1:1) |
| Parameter comparison | ||
| Optical inspection structure | 45/0 (45 ring uniform illumination 0 ° reception) | D/8 (diffuse illumination, 8 ° direction reception); SCI/SCE measurement; exclude UV measurement; comply with CIE No. 15, GB/T 3978, GB 2893, GB/T 18833, ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| spectroscopy | Concave grating spectroscopy | Plane grating spectroscopy |
| Sensor | 256 pixel dual array CMOS image sensor | Silicon photodiode array (dual row 40 groups) |
| Field of view | 2°/10° | 2°/10° |
| Illuminant | Combined LED Illuminant, UV Illuminant | Combined Full Light spectrum LED Illuminant |
| Illuminant life | More than 3 million measurements in 5 years | More than 3 million measurements in 5 years |
| UV Illuminant | Includes UV light | |
| Observational Illuminant | A,C,D50,D55,D65,D75,F2,F7,F11,F12 | D65,A,C,D50,F2(CWF),F7(DLF),F10(TPL5),F11(TL84),F12(TL83/U30) |
| Wavelength range | 400~700nm | 400~700nm |
| wavelength interval | 10nm | 10nm |
| Bandwidth | 10nm | 10nm |
| Measurement caliber | Customized single diameter: φ 2mm, φ 4mm, φ 8mm optional | Customized single diameter: MAV: φ 8mm/φ 10mm; SAV: φ 4mm/φ 5mm |
| Repeatability of chromatic value | Delta E * ab within 0.04 (after instrument preheating correction, except for the average value -M3 of 30 whiteboard measurements at intervals of 5s) | MAV/SCI, Delta E * ab within 0.025 (after preheating correction, the average value of 30 whiteboard measurements at intervals of 5s) |
| Inter-instrument Agreement | Delta E * ab within 0.2 (except for the measurement average value of 14 color plates of BCRA series ⅱ -M3) | MAV/SCI, Delta E * ab within 0.2 (BCRA series ⅱ 12 color plate measurement average) |
| Measurement time | About 1.5s | Approximately 1.5 seconds (approximately 3.2 seconds for simultaneous SCI/SCE testing) |
| Measurement mode | Single measurement, average measurement (2~ 99 times) | Single measurement, average measurement (2~ 99 times) |
| Color space | CIE LAB,XYZ,Yxy,LCh | CIE LAB,XYZ,Yxy,LCh,CIE LUV,s-RGB,βxy,Munsell(C/2) |
| Color difference formula | ΔE*ab，ΔE*94,ΔE*00 | ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1),ΔE*cmc(1:1),ΔE*00 |
| Color density | Density value, density difference, Dot area, Dot Gain, overlay, printing characteristics, Print Contrast, shading error and gray scale | |
| Calibration method | Black and white correction box | |
| Software support | Quality control software (download from the official website), PC-side software has powerful functional extensions | SQCX Quality Management Software |
| Data storage | 10000 | 1000 master standards, 20,000 samples (one data can include SCI/SCE at the same time) |
| Interface | USB | USB, trigger switch interface |
| display screen | TFT True Color 3.5inch, Capacitive Touchscreen | TFT True Color 7.0 inch, Capacitive Touchscreen |
| Operating language | Simplified Chinese, English, Traditional Chinese | Simplified Chinese, English, Traditional Chinese |
| Operating temperature | 0~40℃ | 0~40℃ |
| Allowable relative humidity | 0~ 85% RH (no condensation) | 0~ 85% RH (no condensation) |
| Storage temperature | -20~50℃ | -20~50℃ |
| Storage Humidity | 0~ 85% RH (no condensation) | 0~ 85% RH (no condensation) |
| Power supply method | lithium battery | DC 24V, 3A Power Adapter |
| Battery capacity | 5000 times in 8 hours | |
| Dimension | 184*77*105mm | L * W * H = 370 * 240 * 260mm |
| Net weight | Approx. 600g | About 7.8kg |
| Optional accessories | micro printer | Micro printer, foot switch, swirl/spin stand |
| Special features | Supports ISO Status T, E, A, I density measurement; MO, M1, M2, M3 test conditions | Camera view positioning, horizontal or vertical measurement, while SCI/SCE fast measurement |
