| Optical inspection structure |
d/8
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D/8-SCI + SCE (diffuse illumination, 8 ° direction reception, including specular reflection to remove specular reflection)
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| spectroscopy |
Diffraction grating
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Optical inspection device
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| Sensor |
Linear array CCD@2048 pixels
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CMOS sensor
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| Repeatability of chromatic value |
Delta E < 0.08 (the average deviation of the whiteboard is measured 30 times)
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Standard Deviation Value Delta E * ab ≤ 0.04; Average dE * ab ≤ 0.05; MAX Maximum dE * ab ≤ 0.08 (whiteboard measurement 30 times at 5-second intervals after whiteboard calibration)
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| Inter-instrument Agreement |
Delta E < 0.5 (measurement X-RITE 24 Color Chart)
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ΔE*ab≤0.4
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| Measurement mode |
Test the standard first and then test the sample
|
visual
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| Color space |
CIEL*a*b*、CIEL*C*h、Yxy
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CIE-Lab,CIE-LCh,HunterLab,CIE-Luv,XYZ,Yxy,RGB
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| Data storage |
Store 100 master standards, store 16,000 samples
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20,000 data
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| display screen |
TFT True Color 2.8 inches (16:9)
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IPS full color screen, 2.4 inches
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| display content |
Master standard data, Specimen data, Measurement conditions, Reflection spectrum Linear dispersion, Color simulation
|
|
| Allowable relative humidity |
Relative humidity below 85%, no condensation
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|
| Special features |
Small area curved surface measurement, low power design, fast measurement, high Stability, rich display content
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Automatic calibration, SCI/SCE, 30 + measurement indicators, 26 Illuminant evaluation indicators, guaranteed metrology authentication, ColorSchemer studio
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