GB/T 41852-2022
Semiconductor devices—Micro-electromechanical devices—Bend-and shear-type test methods of measuring adhesive strength for MEMS structures

GB/T 41852-2022 specifies bending and shear test methods for measuring the adhesion strength between MEMS microstructures and substrates, applicable to micro-scale units with widths and thicknesses ranging from 1 μm to 1 mm. The standard employs columnar specimens, applying bending or shear stresses separately to measure the maximum load at delamination, thereby calculating the adhesion strength. Key instruments include a micro-force testing system, a displacement actuator, an alignment device, and a data recorder. The test requires controlling the blade contact angle and the specimen’s aspect ratio to ensure precise loading direction, providing a unified technical basis for material selection, process optimization, and quality control of MEMS devices.

This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
Status Active
CCS L55 ICS 31.080.99
Release Date 2022-10-12 00:00:00 Implementation Date 2022-10-12 00:00:00