GB/T 4937.11-2018 standard specifies the two-liquid-bath test method used to evaluate the ability of semiconductor devices to withstand rapid temperature changes. Its core principle is to subject the device to severe thermal shock by rapidly transferring the specimen between two liquid medium baths set at specific high and low temperatures. This method is primarily used to simulate the harsh thermal stress that devices may encounter in practical applications, such as during high-temperature liquid cleaning. The key instrument for conducting this test is a specially designed two-liquid-bath thermal shock test chamber, which provides the rapid temperature transition conditions required by the standard.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | L40 | ICS | 31.080.01 |
| Release Date | 2018-09-17 00:00:00 | Implementation Date | 2019-01-01 00:00:00 |
