This standard specifies a salt spray test method for determining the corrosion resistance of semiconductor devices, simulating accelerated testing under harsh coastal atmospheric conditions. The method is applicable for evaluating devices operating in maritime and coastal areas and is considered a destructive test. The core testing instrument required for performing this test is a salt spray test chamber. The equipment requirements include a temperature-controlled chamber with corrosion-resistant fixtures, a salt solution tank for preparing sodium chloride solutions at specific concentrations (0.5% to 3%), nozzles and a compressed air source for atomizing the salt solution, and a device for maintaining humidity. After the test, results are typically observed and evaluated using a magnifying glass with magnification ranging from 1x to 20x.