Field Emission Electron Microscope (FEEM)

Field emission electron microscopes utilize a needle tip to emit an electron beam under a strong electric field, which is then focused by electromagnetic lenses to scan the sample surface. Imaging is achieved by detecting secondary electrons or backscattered electrons. This technique is used to observe the morphology and composition distribution of nanoscale materials and is suitable for analyzing the microstructure of semiconductors, biological samples, and other materials.
Selection
When selecting, consider the sample's conductivity to decide whether coating is needed; resolution should match observation requirements; the acceleration voltage range affects penetration depth. Combined with energy spectrum analysis capabilities, it can be configured according to element detection needs. Choose an appropriate stage based on the sample chamber size, and note that vacuum system stability is related to image quality.

Instruments

With 20~ 200 times magnification, equipped with 8 adjustable luminance LED lights, support 2 million pixel image interpolation to 5 million pixels, easy to observe surface fine structure.

$ 678.00

Equipped with flat-field color difference-eliminating objective lens and large-field eyepiece, four-hole inward tilting converter positioning accuracy ≤ 0.006mm, Abbe condenser NA1.25, coarse fine-tuning coaxial mechanism fine-tuning grid value 0.002mm, 3W LED cold Illuminant lighting.

$ 877.00

Optical inspection system with infinity, equipped with 4X-100X flat field color difference elimination objective lens and WF10X-16X large field of view eyepiece, providing NA1.25 condenser lens and 0.001mm fine-tuning accuracy, support phase contrast observation function, comfortable and convenient operation.

$ 1913.00

Optical inspection system with infinity and Modular function design, equipped with flat-field color difference-cancelling fluorescent objective, with a fretting grid value of 2 μm, supports a variety of excitation bands of fluorescent filter sets to meet the needs of scientific research and observation.

$ 3753.00

High Accuracy Observation and Analysis of Birefringent Substances with Stress-free Flat Field Objectives and Large Field Eyepieces, Fretting Grid of 2 μ m, Rotating Stage and Transmission Reflection Illumination.

$ 3075.00

Optical inspection system with infinity, equipped with 4X-100X flat-field color difference elimination objective lens and WF10X large-field eyepiece, providing 2 μm fretting grid value coaxial focusing system, double-decked mechanical stage moving range of 75 × 50mm.

$ 1913.00

Equipped with infinity flat field color difference elimination objective lens and large field of view eyepiece to provide high-quality Optical Properties; using 3W LED cold Illuminant lighting and coaxial coarse fine-tuning system, the fine-tuning grid value reaches 0.001mm, and the operation is comfortable and accurate.

$ 1977.00

Optical inspection system with infinite distance, equipped with flat-field color difference eliminating fluorescent objective, fretting grid value of 2 μ m, coarse fretting coaxial focusing, support for a variety of fluorescent filter sets, suitable for low-illumination microscopic image shooting.

$ 4398.00

Optical inspection system and Modular design, equipped with flat-field color difference elimination fluorescent objective, fretting grid value of 2 μ m, support multi-band fluorescent filter group, comfortable operation.

$ 4688.00

It has the function of switching between light and dark field of view, supports 40X-1600X magnification range, and uses oblique illumination to make the outline of the sample clearly visible. It is suitable for morphological observation of unstained biological samples.

$ 761.00

It adopts coaxial focusing mechanism with coarse fretting, with a fretting grid value of 2 μ m, equipped with 100W high voltage mercury lamp fluorescent epiphany illumination and 6V 20W halogen lamp transmission illumination, and supports B excitation light band 420~ 485nm and G excitation light band 460~ 550nm.

$ 2575.00

Optical inspection system with infinity, equipped with 4X-100X flat field color difference elimination objective and WF10X-16X wide field eyepiece, with 3W LED cold Illuminant lighting and 216x150mm double-decked activity platform, support experimental photography and geometry measurement functions.

$ 1977.00

Equipped with large field of view eyepiece and long working distance flat field color difference objective lens, working distance up to 50mm, with phase contrast device to observe unstained transparent living body, fretting grid value of 2μm to ensure accurate focusing.

$ 2784.00

Equipped with Sony IMX178 Sensor, 3072x2048 resolution, supports real-time image stitching and depth of field fusion functions, global shutter technology ensures distortion-free shooting of dynamic samples, and USB3.0 interface realizes 40fps high-speed imagery.

$ 1493.00

Equipped with Sony 5 million pixel CMOS Sensor, supports global shutter and 35fps high-speed imagery, real-time image stitching and depth of field fusion functions to optimize the operation process and improve work efficiency.

$ 3268.00