Featuring a D/8 optical structure with repeatability ΔE*ab not exceeding 0.03, it allows for customizable color difference thresholds for QC inspection. Supporting 7 color spaces and 6 color difference formulas, it meets the color management needs of multiple industries.
Optical inspection grade quartz containers for measurement of liquids, slurries, powders and fine particles simplify the Sample Handling process and improve measurement efficiency.
Optical inspection system with infinity, semi-retouching color difference objective and phase contrast condenser provides 40X-1000X magnification for viewing thicker samples and enhancing the three-dimensional profile of cell structure.
Optical inspection system with dual beam of light feedback compensates for Illuminant fluctuation in real time, Light spectrum reflectance Repeatability Standard Deviation is less than 0.1%, and the inter-device difference Delta E * ab is as high as 0.08, which can accurately measure fluorescent materials without UV correction.
45 °/0 ° Optical inspection geometry, the measurement results are consistent with visual inspection; 8mm measurement diaMeter, Repeatability Delta E * ab within 0.08; built-in whiteboard paraMeters do not need each calibration, dual positioning technology to improve measurement accuracy.
Using 45/0 Optical inspection structure and 256 pixel dual array CMOS sensor, Repeatability Delta E * ab is controlled within 0.02, supporting a variety of measurement diaMeters and fluorescent samples to ensure accurate and stable Color data.
Optical inspection system and Modular design, equipped with flat-field color difference elimination fluorescent objective, fretting grid value of 2 μ m, support multi-band fluorescent filter group, comfortable operation.
Using diffuse transmission optical path design, optical density Measurement range 0.00-6 OD, light transmitance accuracy +/- 2%, can simultaneously measure light transmitance, absolute optical density, relative optical density and Dot area ratio.
Adopt dual optical path design to improve measurement Stability, Repeatability accuracy up to dE * ab ≤ 0.03; Integrated Nano Optical inspection device Film thickness is only 5 microns, supports 40 kinds of light sources and more than 30 kinds of measurement indicators.
Compact and easy to carry, resolution up to 0.01, Repeatability ≤ 0.02. Adopts dual light path design, supports three Standard light sources and multiple measurement calibers, and data can be stored in the cloud through the mobile phone Mini Program.
Width 2cm, optical path 10mm, dimensions 12.5 × 22.5 × 45mm, specially designed for Spectrophotometer matching Cuvette, to ensure Optical inspection detection accuracy.
Featuring a 20mm large aperture design, it enables uniform measurement of textured and rough surfaces; repeatability ΔE*ab ≤ 0.03 ensures high precision; equipped with a touchscreen and color card matching for convenient operation, supporting multiple color difference formulas and color spaces.
Optical inspection system with infinite distance, equipped with flat-field color difference eliminating fluorescent objective, fretting grid value of 2 μ m, coarse fretting coaxial focusing, support for a variety of fluorescent filter sets, suitable for low-illumination microscopic image shooting.
Repeatability and accuracy are ensured with dual optical path sensing arrays and UV reinforced silicon photodiodes with 0.0001 resolution, 0-200% Transmittance Measurement range and support for APHA/PtCo, Gardner and Saybolt chroma scales.
The width is 3cm, the optical path is 10mm, and the dimensions are 12.5 × 32.5 × 45mm. As a special accessory for Spectrophotometer, it ensures the stability of the optical path and the accuracy of measurement.
