Overview
The Defelsko PRBN-D Thickness Gauge Probe is a removable built-in Probe designed for the PosiTector series of thickness gauges for nonconductive Coating thickness measurement on ferrous substrates (steel and cast iron). The Probe provides High Accuracy measurement from 0 to 1500 μm and uses the eddy Current principle to ensure reliable operation in a variety of industrial applications.
Features
1. Removable built-in Probe design for easy maintenance and replacement
2. Suitable for one-handed operation, improving the convenience of use
3. High Accuracy measurement with +/- 1% error
4. Up to 0.1 μm resolution, ensuring fine measurement
5. Provide calibrated certificate to ensure measurement accuracy
6. Suitable for PosiTector series host, strong compatibility
Principle
The Probe operates on the principle of eddy Current. When the Probe contacts the coating surface, an electromagnetic field is generated, and the thickness of the nonconductive coating is measured by detecting the change of eddy current in the substrate. The measurement results are displayed digitally, and the accuracy is calculated by combining the fixed value and the reading percentage.
Applications
Industrial coating testing, metal corrosion measurement, quality control, maintenance inspection
Standards
Provide calibrated certificate
Steps
1. Install Probe on a compatible PosiTector host
2. Turn on the host power and select the corresponding Measurement mode
3. Place the Probe vertically on the surface of the coating to be tested
4. Read the thickness value after stable contact
5. Record or store measurement data
6. Clean Probes After Use and Store Properly
Notice
• Ensure that the Probe is compatible with the host to avoid mismatch use
• Probe vertical during measurement to prevent angle deviation from affecting accuracy
• Avoid long-term use in extreme temperatures or humid environments
Periodically calibrated to maintain measurement accuracy
• Probe surfaces cleaned to prevent contamination from interfering with measurement results
• Avoid collision or heavy pressure during storage to protect the Probe structure
