| Probe Type |
Magnetic Induction + eddy Current
|
|
| Measurement Range |
0~ 1250μm (chrome plating on copper 0~ 40μm)
|
0-1250μm
|
| Low resolution |
0.1μm (0-100μm), 1μm (100-1250μm)
|
|
| display screen |
Back view, four-digit reading display, two-line statistical display, Chinese operation
|
LED LCD display
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| Calibrated mode |
Manufacturer calibrated, zero calibrated, calibrated foil calibrated
|
Zero point calibrated, two point calibrated
|
| Indication Error (two point calibrated) |
±[(1~3%H)+1] ±[(1~3%H)+1.5]
|
|
| Test conditions Minimum face value diameter |
F Type φ 7mm, N Type φ 5mm
|
|
| Test conditions Matrix critical thickness |
F Type 0.5mm, N Type 0.3mm
|
|
| Operating Environment |
No strong magnetic field environment
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|