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| Product Name | YUEFENG 754N UV-Visible SpectroPhotometer | ShangFen 754N UV-Visible SpectroPhotoMeter |
| Product Price | $848.00 | In coming |
| Details | Details | |
| Model comparison | ||
| Spectral Type | UV-Vis | UV-Vis |
| Optical Path | Single-Beam | Single-Beam |
| Dispersion | Grating | Grating |
| Detection | Scanning | |
| Light Source | Tungsten Deuterium | Tungsten Deuterium |
| Wavelength | 190-1100nm | 200-1000nm |
| Accuracy | ≤1nm | ≤2nm |
| Bandwidth | 2-4nm | ≤2nm |
| Detector | Others | |
| Stray Light | ≤0.1%T | ≤0.1%T |
| Parameter comparison | ||
| Optical inspection system | Aberration (1200L/mm Grating) | |
| Light spectrum Bandwidth | 4nm | 2nm |
| Wavelength Range | 195m~1100nm | |
| Wavelength Precision | ±1.0nm | ±2nm |
| Wavelength Repeatability | ≤0.5nm | ≤1nm |
| Photometric Range | 0~200%T，-0.301~3.000A，0~9999C | 0.0 ~ 200.0% T；-0.097 ~ 4.000A；0.000 ~ 9999C |
| Photometric Precision | ±0.002A（0~0.5A）；±0.003A（0.5~1A）；±0.5%T（0~100%T） | ±0.5%T；±0.004Abs（0 ~ 0.5A）；±0.008Abs（0.5 ~ 1A） |
| Luminosity Repeatability | ≤0.001A（0~0.5A）；≤0.002A（0.5~1A）；≤±0.2%T（0~100%T） | ≤ 0.2%T；0.002Abs（0 ~ 0.5A）；0.004Abs（0.5 ~ 1 A） |
| stray light | ≤0.1%T(220nm，360nm) | ≤ 0.1% (T) (at 220 nm, as Nal) (at 360 nm, as NaNO2) |
| Noise level | 100%≤0.15%T；0%≤0.01%T | |
| Baseline flatness | ±0.002A | |
| printout | Parallel entrance | |
| Illuminant | Deuterium lamp, tungsten halogen lamp | |
| Concentration Range | 0~1999 | |
| drift | ≤0.001A/h@500nm | |
| scanning speed | Fast, medium, slow. | |
| display | High-quality 128x64-bit graphics LCD screen | 7-Inch color touchscreen |
