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| Product Name | YUEFENG 755 UV-Visible SpectroPhotoMeter | YUEFENG 770S UV-Visible SpectroPhotometer |
| Product Price | In coming | $2591.00 |
| Details | Details | |
| Model comparison | ||
| Spectral Type | UV-Vis | UV-Vis |
| Optical Path | Single-Beam | Pseudo-Double-Beam |
| Dispersion | Grating | Grating |
| Detection | Scanning | |
| Light Source | Tungsten Deuterium | Tungsten Deuterium |
| Wavelength | 200-1000nm | 190-1100nm |
| Accuracy | ≤1nm | ≤0.5nm |
| Bandwidth | ≤2nm | ≤2nm |
| Detector | ||
| Stray Light | ≤0.5%T | ≤0.2%T |
| Parameter comparison | ||
| Optical inspection system | Aberration (1200L/mm Grating) | Proportional double beam of light, 1200/mm Holographic grating |
| Light spectrum Bandwidth | 2nm | 2nm |
| wavelength Range | 195m~1000nm | |
| Wavelength Precision | ±1nm | ±0.5nm |
| Wavelength Repeatability | ≤0.5nm | ≤0.2nm |
| Photometric Range | 0~200.0%(T),-0.301~1.999(A) | 0.0%(T)~200.0%(T)；-0.301~4.000(A) |
| Photometric Precision | ±0.5%(T) | ±0.5%(T) |
| Luminosity Repeatability | ≤0.2%(T) | ≤0.2%(T) |
| stray light | ≤0.3%(220nm，360nm) | ≤ 0.15% (T) (at 220 nm, as NaI) (at 360 nm, as NaNO2) |
| drift | ≤0.002A/h@500nm | ≤ 0.0009A/0.5h (2h after startup, 250nm, 500nm) |
| Concentration Range | 0~1999 | |
| light source | Deuterium lamp, tungsten halogen lamp | |
| printout | serial port | RS232 printing interface |
| analysis software | optional | |
