| Color difference formula |
ΔE*ab
|
ΔE*ab
ΔE*94
ΔE*00
ΔE*cmc(2:1)
|
| Optical inspection structure |
d/8
|
D/8-SCI + SCE (diffuse illumination, 8 ° direction reception), including specular reflected light Remove specular reflected light
|
| spectroscopy |
Diffraction grating
|
Optical inspection device
|
| Sensor |
Linear array CCD@2048 pixels
|
CMOS sensor
|
| Field of view |
CIE10 ° Standard Observer, CIE2 ° Standard Observer
|
CIE 2°/10°
|
| Observational Illuminant |
A、C、D65、F2（CWF）
|
A,B,C,D50,D55,D65,D75,F1-F12,CWF,U30,U35,DLF,NBF,TL83,TL84
|
| Repeatability of chromatic value |
Delta E < 0.08 (the average deviation of the whiteboard is measured 30 times)
|
Standard Deviation Value Delta E * ab ≤ 0.04; Average: dE * ab ≤ 0.05; MAX Maximum: dE * ab ≤ 0.08 (whiteboard measurement 30 times at 5 second intervals after whiteboard calibrating)
|
| Inter-instrument Agreement |
Delta E < 0.5 (measurement X-RITE 24 Color Chart)
|
ΔE*ab≤0.4
|
| Color space |
CIEL*a*b*、CIEL*C*h、Yxy
|
Light spectrum reflectance, CIE-Lab, CIE-LCh, HunterLab, CIE-Luv, XYZ, Yxy, RGB
|
| Data storage |
Storage master standard 100 storage samples 16000
|
20,000 data
|
| display screen |
TFT True Color 2.8 inches @(16:9)
|
IPS full color screen, 2.4 inches
|
| display content |
Master standard data, Specimen data, Measurement conditions, Reflection spectrum Linear dispersion, Color simulation
|
|
| Allowable relative humidity |
Relative humidity less than 85%, no condensation
|
|
| Storage Humidity |
Relative humidity less than 85%, no condensation
|
|
