| Optical inspection system |
Double beam of light system
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Proportional double beam of light, 1200/mm Holographic grating
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| Wavelength accuracy |
+/- 0.1Nm (D2 656.1nm ), +/- 0.3nm full band
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| Photometric Range |
0~200%T、-4~4A
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0.0%(T)~200.0%(T);-0.301~4.000(A)
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| Photometric accuracy |
±0.002A(0~0.5A)、±0.004A(0.5~1A)、±0.2 %T (0~100 %T)
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| Luminosity, sexual repeability |
±0.001A(0~0.5A);±0.002A(0.5~1A);±0.1%T(0~100%T)
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| stray light |
≤0.03%T
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≤ 0.15% (T) (at 220 nm, as NaI) (at 360 nm, as NaNO2)
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| Noise level |
≤0.0004 Abs/h
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100%(T):≤0.2%(T) 0%(T):≤0.1%(T)
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| drift |
≤± 0.0004 Abs/h
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≤ 0.0009A/0.5h (2h after startup, 250nm, 500nm)
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| Illuminant |
190 nm~1100 nm
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Deuterium lamp, tungsten halogen lamp
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| Detector |
Imported silicon photodiode
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| data interface |
Parallel interface or USB interface
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| power supply |
AC 220V/50Hz or AC 110V/60Hz
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