With transmission and reflection dual lighting mode, support brightfield and polarized observation, objective magnification 4X-100X, pupil distance 55-75mm, hinged barrel can rotate 360 degrees freely.
Infinity Optical inspection system, support a variety of Observation methods, equipped with six-hole objective lens converter and N.A.1.1 Abbe condenser, magnification 40X-1000X, easy and flexible operation.
Infinity Optical inspection system, support for Brightfield, Fluorescence, Phase Contrast, Polarization Observation mode; equipped with six-hole converter with DIC slot and 100W mercury lamp light source, providing high-resolution images; autofocus system to maintain sample focal plane stability.
Heavy-duty stainless steel structure ensures stable support, equipped with 3 strong magnets for firm adsorption, maintaining the vertical state of Microscope, suitable for various metal surface fixing needs.
Provides 40x magnification and a 0.60 numerical aperture to ensure high resolution and long working distances for a variety of Microscope applications.
Made of aluminum, Dimension 150 * 220 * 290mm, support 360 ° swirl/spin adjustment and arm adjustable, suitable for a variety of Microscope models.
The device features an infinity distance Brightfield metallographic objective for long working distance measurements, high luminance LED or halogen lighting options, and supports 12 million pixel high definition CCD imagery.
Optical inspection system to improve imagery mass, working distance up to 20mm, support a variety of observation methods, magnification 40X-1000X, to meet different experimental needs.
Infinity Optical inspection system provides high resolution images, equipped with six hole objective converter and N.A.1.1 Abbe condenser, supports autofocus and multiple Observation methods, magnification 40X-1000X.
Optical inspection system with infinite distance, equipped with phase contrast condenser and variable light bar, magnification 40X-1600X, support phase contrast objective and brightfield observation, expandable fluorescence and other auxiliary devices.
Using infinite distance flat-field Brightfield color difference elimination objective, fretting grid value of 2 μ m, equipped with drop and transmission illumination system, can perform Brightfield, polarizing and DIC observation, suitable for semiconductor wafer inspection and precision mold analysis.
Support capillary tubing and hot stage two measurement methods, temperature range RT +~ 320 ℃, Microscope 40 times magnification observation, sexual repeability +/- 1 ℃ (≤ 200 ℃), to meet the melting point of crystalline organic compounds determination needs.
Optical inspection system with infinity and Modular function design, equipped with flat-field color difference-cancelling fluorescent objective, with a fretting grid value of 2 μm, supports a variety of excitation bands of fluorescent filter sets to meet the needs of scientific research and observation.
Microscope observation mode, support capillary method and hot table method, temperature range RT +~ 320 ℃, resolution 0.1 ℃, repeability +/- 1 ℃ (≤ 200 ℃), Draft Shield design to reduce environmental impact.
Using binocular stereo Microscope observation, support capillary method and hot table method two measurement methods, temperature resolution of 0.1 ℃, repeability +/- 1 ℃ (≤ 200 ℃), with Draft Shield to reduce environmental impact.
