Light spectrum analysis technology using dual optical path, equipped with pulse xenon arc and LED dual Illuminant, support SCI + SCE simultaneous measurement, Measurement time is less than 4 seconds, with temperature and Humidity calculation compensation function.
Repeatability and accuracy are ensured with dual optical path sensing arrays and UV reinforced silicon photodiodes with 0.0001 resolution, 0-200% Transmittance Measurement range and support for APHA/PtCo, Gardner and Saybolt chroma scales.
Measurement range 0-40000W/m ², Light spectrum Response 1000-1700nm, can automatically calculate and display infrared barrier rate, photosensitive aperture 10mm, suitable for performance testing of various Infrared sources and thermal insulation materials.
Using 3-in-1 optical path design, one hole can simultaneously measure three wavelengths transmittance. Equipped with 1mm test aperture and Automatic calibration function, support 850nm/940nm infrared and 550nm visible light measurement, accuracy of +/- 2%.
Dual light path design improves Repeatability to dE * ab ≤ 0.03, equipped with nano integrated Optical inspection device to achieve accurate spectroscopy; supports Automatic calibration and dual aperture switching, built-in camera to accurately locate the measurement area, compatible with a variety of Software platforms.
Adopt three-in-one parallel light path design, one measurement of visible light, infrared and ultraviolet transmittance; test aperture 1.3mm, suitable for small size and thick materials; Automatic calibration and large capacity storage function.
Equipped with Infrared Sensor and Thermal Probe Dual Measurement mode, Response Time is only 1 second, Optical inspection coefficient is 3:1, support -40~ 150 ℃ wide range temperature measurement, to meet the needs of accurate temperature detection in different scenarios.
Adopt dual optical path design to improve measurement Stability, Repeatability accuracy up to dE * ab ≤ 0.03; Integrated Nano Optical inspection device Film thickness is only 5 microns, supports 40 kinds of light sources and more than 30 kinds of measurement indicators.
Using vanadium oxidation uncooled infrared focal plane Detector, temperature resolution of 0.1 ℃, with 56 ° × 42.2 ° field of view and focus-free design, support center point temperature measurement and cold hot spot automatic tracking function.
Adopt Dual Light Path Array Sensor to Ensure Measurement Stability, Equipped with Camera Assisted Positioning System, Support Φ 8mm/Φ 4mm Dual Aperture Switching, Repeability accuracy Delta E * ab ≤ 0.03, Integrate a variety of Color Spaces and Standard light sources.
The three-in-one optical path measures the transmittance of three wavelengths at one time, the test aperture is 1mm to adapt to small-sized materials, and the parallel light design ensures stable measurement of thick materials, with an accuracy of +/- 2% and a resolution of 0.1%.
It adopts parallel light path design, supports 47mm Film thickness material test, and can simultaneously measure ultraviolet 365nm, infrared 940nm and visible light transmittance. It has real-time self-calibrating function, and the operation is simple and fast to display three results.
The width is 3cm, the optical path is 10mm, and the dimensions are 12.5 × 32.5 × 45mm. As a special accessory for Spectrophotometer, it ensures the stability of the optical path and the accuracy of measurement.
Measurement accuracy of (3 + L/200) μm, equipped with high resolution CCD and adjustable LED Illuminant to avoid thermal deformation of the workpiece.
Dual Light spectrum analysis technology, Wavelength range 360~ 780nm, Support SCI + SCE simultaneous fast measurement, Automatic calibration and Temperature Humidity Compensation to ensure High Accuracy and Stability.
