This standard specifies a comprehensive method for measuring the thickness of metallic coatings using the profilometry method. The core principle involves creating a small step between the coating and the substrate metal, which is then precisely scanned and measured by a profilometer to determine its height, representing the coating thickness. This method is applicable to a wide range of thickness measurements, from 0.01 micrometers to 1000 micrometers. The implementation of this standard requires specialized profilometers, which are primarily categorized into contact-type stylus profilometers and non-contact optical profilometers based on their technical principles. The standard provides detailed specifications for the operational parameters of the instruments, calibration methods, as well as specific sample preparation, measurement procedures, and reporting requirements.
| Status | Incoming | ||
|---|---|---|---|
| CCS | A29 | ICS | 25.220.40 |
| Release Date | 2025-10-31 00:00:00 | Implementation Date | 2026-05-01 00:00:00 |
